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A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change

Abstract : This paper describes a fast methodology for managing the obsolescence issues of integrated circuits in industrial equipment (aeronautical or automotive). The objective is to predict EMC non-compliance risk, especially for conducted immunity, after a component change. Based on black box modeling using S-parameters, this experimental approach consists in declining the conducted immunity requirements, from the input of the equipment to the pins of the replaced component. Once this transfer function is established, a link is envisaged between the immunity level determined at the boundary of the component to be replaced and that of the new one. This link allows the prediction of EMC non-compliance risk level, from an equivalent test at the component level, due to a change of a component.
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https://hal.laas.fr/hal-03654075
Contributor : Alexandre Boyer Connect in order to contact the contributor
Submitted on : Thursday, April 28, 2022 - 12:44:17 PM
Last modification on : Wednesday, June 1, 2022 - 4:25:45 AM

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Saliha Chetouani, Alexandre Boyer, Sonia Ben Dhia, Sébastien Serpaud, André Durier. A Technique to Assess Conducted Immunity of an Electronic Equipment after an Obsolete Integrated Circuit Change. 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2021), Mar 2022, Brugges, Belgium. ⟨10.1109/EMCCompo52133.2022.9758624⟩. ⟨hal-03654075⟩

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