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Journal Articles Microelectronic Engineering Year : 2013

SERS-active substrates for investigating ultrathin spin-crossover films


The detection and characterization of extremely small quantities of material (e.g. ultrathin films) are still a big challenge in order to study the change of physical properties when reducing the size of the system. Surface Enhanced Raman Scattering (SERS) is known as a sensitive technique for detecting even isolated molecules of a given material. When the sample is deposited on Au or Ag nanostructures the Raman signal intensity of the studied compound is exalted. In this paper are presented two different approaches to obtain SERS spectra of ultrathin films of the spin-crossover compound Fe(pz)[Pt(CN)4]. Using both strategies we were able to record SERS spectra of continuous thin films and nanometric patterns (down to 200 nm). Moreover, by comparing the two methods, we suggest that the resulting SERS spectrum is attributed to the molecules located at the vicinity of the SERS-active substrate. Thermal study of the SERS spectrum in the spin-crossover temperature range is also discussed.
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Dates and versions

hal-00993168 , version 1 (19-05-2014)
hal-00993168 , version 2 (16-04-2018)



Carlos Bartual-Murgui, Aline Cerf, Christophe Thibault, Christophe Vieu, Lionel Salmon, et al.. SERS-active substrates for investigating ultrathin spin-crossover films. Microelectronic Engineering, 2013, 111, pp.365 - 368. ⟨10.1016/j.mee.2013.02.102⟩. ⟨hal-00993168v2⟩
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