N. Monnereau and F. Caignet, Investigation of Modeling System ESD Failure and Probability Using IBIS ESD Models, IEEE Transactions on Device and Materials Reliability, vol.12, issue.4, pp.12-599, 2012.
DOI : 10.1109/TDMR.2012.2218605

URL : https://hal.archives-ouvertes.fr/hal-00941823

J. Barth, TLP calibration, correlation, standards, and new techniques, Electrical Overstress Electrostatic Discharge Symposium Procedings, pp.85-96, 2000.
DOI : 10.1109/6104.930960

P. Besse, F. Lafon, N. Monnereau, F. Caignet, J. P. Laine et al., ESD system level characterization and modeling methods applied to a LIN transceiver, EOS/ESD Symposium, pp.329-337, 2011.

Y. Cao, Rise-Time Filter Design for Transmission-Line Pulse Measurement Systems, 2009 German Microwave Conference, pp.1-5, 2009.
DOI : 10.1109/GEMIC.2009.4815848

E. Kuo-husuan-meng and . Rosenbaum, Piecewise- Linear With Transient Relaxation for Circuit-Level ESD Simulation, IEEE Trans. On Device and Materials Reliability, p.15, 2015.