Hierarchical Modeling Approach for System Level ESD Analysis: From Hard to Functional Failure

Abstract : With the increased number of embedded systems into our surrounding area, the electronic devices are exposed to more severe environments and have to survive ElectroStatic Discharges (ESD). Both hard and functional failures have to be guaranteed. In this paper, we will present the methodology we started to develop eight years ago to predict the impact of (ESD). Through two main examples, we will show that a behavioral modeling of the device can give good simulation results. The next step will be the implementation of failure criteria to predict both hard and functional robustness. This paper is a summary of the various results obtained.
Type de document :
Communication dans un congrès
Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) , May 2015, TAIPEI, Taiwan. IEEE, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 4p., 2015, 〈http://www.apemc.org/Past_APEMC/apemc2015/apemc2015.html〉. 〈10.1109/APEMC.2015.7175399〉
Liste complète des métadonnées

Littérature citée [1 références]  Voir  Masquer  Télécharger

https://hal.archives-ouvertes.fr/hal-01843414
Contributeur : Marise Bafleur <>
Soumis le : jeudi 2 août 2018 - 15:59:04
Dernière modification le : mardi 11 septembre 2018 - 15:19:12

Identifiants

Citation

Fabrice Caignet, Rémi Bèges, Patrice Besse, Jean-Philippe Lainé, Nicolas Nolhier, et al.. Hierarchical Modeling Approach for System Level ESD Analysis: From Hard to Functional Failure. Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) , May 2015, TAIPEI, Taiwan. IEEE, 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC), 4p., 2015, 〈http://www.apemc.org/Past_APEMC/apemc2015/apemc2015.html〉. 〈10.1109/APEMC.2015.7175399〉. 〈hal-01843414〉

Partager

Métriques

Consultations de la notice

29

Téléchargements de fichiers

15