Y. Koide, M. Yokoba, A. Otsuki, F. Ako, T. Oku et al., Diamond Relat. Mater, vol.6, p.847, 1997.

K. Das, V. Venkatesan, K. Miyata, D. L. Dreifus, and J. T. Glass, Thin Solid Films, vol.212, p.19, 1992.

M. Suzuki, T. Sakai, T. Makino, H. Kato, D. Takeuchi et al., Phys. Status Solidi, vol.210, p.2035, 2013.

S. R. Shatynski, Oxid Met, vol.13, p.105, 1979.

J. H. Klootwijk and C. E. Timmering, Merits and limitations of circular TLM structures for contact resistance determination for novel III-V HBTs, Proc. 2004 Int. Conf. Microelectron. Test Struct, vol.17, 2004.

V. Mortet, Z. Vl?ková-?ivcová, A. Taylor, O. Frank, P. Hubík et al., Refined analysis of boron doped diamond Raman spectrum, 28 th International Conference on Diamond and Carbon Materials, Gothia Towers

V. Mortet, J. Pernot, F. Jomard, A. Soltani, Z. Remes et al., Diamond Relat. Mater, vol.53, p.29, 2015.

C. Johnston, P. R. Chalker, I. M. Buckley-golder, M. Van-rossum, M. Werner et al., Mater Sci Eng B, vol.29, p.206, 1995.

J. Nakanishi, A. Otsuki, T. Oku, O. Ishiwata, and M. Murakami, J. Appl. Phys, vol.76, p.2293, 1994.