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GaN Technologies: From The Improvement Of Device Reliability To The Design Of Robust High Frequency Circuits

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https://hal.laas.fr/hal-02088233
Contributor : Jean-Guy Tartarin <>
Submitted on : Tuesday, April 2, 2019 - 4:36:17 PM
Last modification on : Friday, January 10, 2020 - 9:10:08 PM

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  • HAL Id : hal-02088233, version 1

Citation

Jean-Guy Tartarin. GaN Technologies: From The Improvement Of Device Reliability To The Design Of Robust High Frequency Circuits. World Congress of Advanced Materials (WCAM 2016 5th BIT congress), Jun 2016, Chongqing, China. ⟨hal-02088233⟩

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