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New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs

Nabil El Belghiti Alaoui 1 Patrick Tounsi 2 Alexandre Boyer 1 Arnaud Viard 3
1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
LAAS - Laboratoire d'analyse et d'architecture des systèmes
2 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : With the density increase of today's printed circuit board assemblies (PCBA), the electronic fault detection methods reached their limits, in the same time the requirements of high reliability and robustness are greater. Industrials are obliged to reduce the number of physical test points and to find better-adapted test methods. Current test methods must be rethought to include a large panel of physical phenomena that can be used to detect electrical defects of components, absence, wrong value, and shorts at component level on the board under test (BUT). We will present the possibility of using electromagnetic signature to diagnose faulty components contactlessly. The technic consists in using small diameter near electromagnetic field probes which detect the field distribution over powered sensitive components. The biasing of the BUT is specifically chosen to enhance the sensitivity of the EM measurements. Reference EM signatures are extracted from a fault-free circuit, which will be compared to those extracted from a sample PCBA in which we introduced a component level defect by shorting, removing or changing the value of critical components. As a result, we will show that the amplitude of a specific harmonic acts as a sensing parameter, which is accurately related to the variation of the component value. Preferred presentation: [ ] Oral [ ] Poster [x] No preference Preferred track (please, tick one or number 1 to 3 tracks in order of preference: 1 = most suiting, 3 = least suiting) [2] A-Quality and Reliability Assessment Techniques and Methods for Devices and Systems [ ]
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Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. New defect detection approach using near electromagnetic field probing for high density PCBAs New defect detection approach using near electromagnetic field probing of high density PCBAs. 29 th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2018), Oct 2018, Aalborg, Denmark. ⟨10.1016/j.microrel.2018.07.090⟩. ⟨hal-02319457⟩

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