A new probing technique for highspeed/high-density printed circuit boards, Test Conference, 2005. Proceedings. ITC 2005. IEEE International, p.10, 2005. ,
Analog/digital testing of loaded boards without dedicated test points, Proceedings International Test Conference 1996. Test and Design Validity, pp.325-332, 1996. ,
URL : https://hal.archives-ouvertes.fr/hal-00016094
, Test access component for automatic testing of circuit assemblies, A.J.Suto, US patent application
PCB Testing Using Infrared Thermal Signatures, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings, vol.3, pp.1970-1974, 2005. ,
, Method for testing printed and unprinted circuit board assemblies aligning a focused, high-frequency electromagnetic transmission beam to irradiate a component to be tested and produce a spectral measuring signal, pp.19837169-19837170
Method and apparatus for high-speed scanning of electromagnetic emission levels, pp.1997017617-1997017618 ,