K. P. Parker, A new probing technique for highspeed/high-density printed circuit boards, Test Conference, 2005. Proceedings. ITC 2005. IEEE International, p.10, 2005.

C. Vaucher and L. Balme, Analog/digital testing of loaded boards without dedicated test points, Proceedings International Test Conference 1996. Test and Design Validity, pp.325-332, 1996.
URL : https://hal.archives-ouvertes.fr/hal-00016094

, Test access component for automatic testing of circuit assemblies, A.J.Suto, US patent application

H. Moldovan, M. Marcu, and M. Vladutiu, PCB Testing Using Infrared Thermal Signatures, 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings, vol.3, pp.1970-1974, 2005.

, Method for testing printed and unprinted circuit board assemblies aligning a focused, high-frequency electromagnetic transmission beam to irradiate a component to be tested and produce a spectral measuring signal, pp.19837169-19837170

G. Gunthorpe and &. D. James, Method and apparatus for high-speed scanning of electromagnetic emission levels, pp.1997017617-1997017618