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Detecting PCB Assembly defects using infrared thermal signatures

Nabil El Belghiti Alaoui 1 Patrick Tounsi 2 Alexandre Boyer 1 Arnaud Viard 3
1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
LAAS - Laboratoire d'analyse et d'architecture des systèmes
2 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : A Printed Circuit Board assembly (PCBA) testing approach using infrared thermal signatures is presented. The concept of thermal signature for PCBAs is introduced. Based on this concept, the testing method is able to:-detect assembly defects such as presence, polarity, value and solder (shorts and opens) and in some cases component health state-classify the components mounted on the PCB into a number of classes (e.g.-fault free(reliable), functional (less reliable), faulty). According to the thermal signature of each component on the PCBA, PCBAs can be also classified in the same number of classes. In this article a special focus is put on capacitor defects especially capacitor value defects. Therefore, they will be the main components tested. The fault detection indicator used in this proof of concept is a statistical mean squared error measure (MSE).
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https://hal.laas.fr/hal-02319460
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Submitted on : Friday, October 18, 2019 - 7:44:55 AM
Last modification on : Thursday, June 10, 2021 - 3:06:02 AM
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Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard. Detecting PCB Assembly defects using infrared thermal signatures. 27th International Conference Mixed Design of Integrated Circuits and Systems (MIXDES2019), Jun 2019, Wroclaw, Poland. ⟨10.23919/MIXDES.2019.8787089⟩. ⟨hal-02319460⟩

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