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A Rigorous Method to extrapolate Radiated Susceptibility from Near-Field Scan Immunity

Alexandre Boyer 1 
1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : Near-field injection or near-field scan immunity is a promising method for the analysis of the susceptibility of electronic boards and circuits. The resulting immunity map provides a precise localization of the sensitive area to electromagnetic disturbances to a given near-field source. However, the extrapolation of the immunity to another radiating source, either in near or far-field, is not trivial. This paper aims at proposing a rigorous post-processing method of near-field scan immunity results to extrapolate radiated immunity in other disturbance conditions, e.g. far-field illumination. The method is described and validated through simulation case studies.
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Submitted on : Friday, October 18, 2019 - 7:46:51 AM
Last modification on : Wednesday, June 1, 2022 - 5:08:52 AM
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  • HAL Id : hal-02319463, version 1


Alexandre Boyer. A Rigorous Method to extrapolate Radiated Susceptibility from Near-Field Scan Immunity. International Symposium on Electromagnetic Compatibility (EMC Europe 2019), Sep 2019, Barcelona, Spain. ⟨hal-02319463⟩



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