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Optimized algorithm to reduce the near-field measurement time on FPGA device

Abstract : This paper presents a sequential adaptive sampling algorithm in order to reduce the measurement time of near-field scan. The originality of this approach is to use a deterministic mesh swept according to a sequential progressive adaptive algorithm that defines whether a point must be captured or not. All the proposed algorithm parameters are set according to spatial field characteristics and the measurement setup. This approach is validated on the measurement of the magnetic field produced in near-field region by a FPGA device.
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https://hal.laas.fr/hal-02319472
Contributor : Alexandre Boyer <>
Submitted on : Friday, October 18, 2019 - 8:01:48 AM
Last modification on : Thursday, June 10, 2021 - 3:03:05 AM
Long-term archiving on: : Sunday, January 19, 2020 - 1:31:35 PM

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  • HAL Id : hal-02319472, version 1

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Sebastien Serpaud, Alexandre Boyer, Sonia Ben Dhia. Optimized algorithm to reduce the near-field measurement time on FPGA device. 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2019), Oct 2019, Haining, China. ⟨hal-02319472⟩

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