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Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System

Abstract : In this paper, a method based on the inherent event-based sampling capability of the laser optical feedback interferometry (OFI) is proposed to recover sub-λ/2 displacement with a nanometric precision. The proposed method operates in open-loop configuration and relies on OFI's fringe detection, thereby improving its robustness and ease of use. The measured white noise power spectral density is less than 100 pm/ √ Hz with a corner noise frequency of approximately 80 Hz for a laser diode emitting wavelength λ0 of 785 nm placed at 30 cm of the target.
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https://hal.laas.fr/hal-02560375
Contributor : Olivier Bernal <>
Submitted on : Friday, May 1, 2020 - 4:30:25 PM
Last modification on : Friday, July 17, 2020 - 9:50:07 PM

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Olivier Bernal, Usman Zabit, Francis Jayat, Thierry Bosch. Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System. IEEE Sensors Journal, Institute of Electrical and Electronics Engineers, 2020, 20 (10), pp.5195-5203. ⟨10.1109/JSEN.2020.2970599⟩. ⟨hal-02560375⟩

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