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Measurement and Deembedding Technique for the on-wafer Characterization of Multiport Devices

Abstract : A useful technique is presented for on-wafer characterization of n-port devices, when measurement accesses are of unequal length and when a m-port vector network analyzer is used with m
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https://hal.laas.fr/hal-02921429
Contributor : Audrey Cayron <>
Submitted on : Tuesday, August 25, 2020 - 10:55:53 AM
Last modification on : Thursday, August 27, 2020 - 9:42:07 AM

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Audrey Cayron, Christophe Viallon, Ayad Ghannam, Alessandro Magnani, Thierry Parra. Measurement and Deembedding Technique for the on-wafer Characterization of Multiport Devices. 2020 IEEE 20th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), Jan 2020, San Antonio (TX), United States. pp.53-56, ⟨10.1109/SIRF46766.2020.9040178⟩. ⟨hal-02921429⟩

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