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Article Dans Une Revue Measurement Science and Technology Année : 2004

Calibrated measurement of the behaviour of mechanical junctions from micrometre to subnanometre scale: the friction force scanner

Résumé

We describe an instrument called a friction force scanner (FFS) able to perform calibrated measurements of the behaviour of mechanical junctions with more than four orders of magnitude of resolution for both displacement and force. A probe carrier is suspended by fibres in an arrangement that provides exactly two degrees of freedom of motion. The suspension makes it possible to measure the carrier displacement by interferometry. A novel differential electrostatic actuator with linear response mounted on the carrier was used to precisely determine the force experienced by a junction. The single-stage design is easily calibrated and can be used for force measurement and scanning, allowing the study of friction at multiple length scales. Measurements involving mica-mica and steel-steel junctions are reported while using the instrument in open loop.

Dates et versions

hal-03433724 , version 1 (28-03-2022)

Identifiants

Citer

Daniel Sidobre, Vincent Hayward. Calibrated measurement of the behaviour of mechanical junctions from micrometre to subnanometre scale: the friction force scanner. Measurement Science and Technology, 2004, 15 (2), pp.451-459. ⟨10.1088/0957-0233/15/2/020⟩. ⟨hal-03433724⟩
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