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Communication Dans Un Congrès Année : 2022

A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC

Résumé

Many works [2][3] make use of high frequency battery models and Printed Circuit Board (PCB) models for EMC emission characterization. This work proposes those models in addition to a Battery Management System (BMS) impedance to show the effect on the noise received by the BMS under Direct Power Injection (DPI) simulations with different external components configurations. Furthermore, in order to ease some of the first design stages of the BMS and its external components, a straightforward analytical model to estimate the noise levels and its maximum coupling frequencies during DPI simulations is also elaborated and validated by simulations.
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Dates et versions

hal-03773319 , version 1 (09-09-2022)

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Badr Guendouz, Philippe Perruchoud, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia. A Simple Analytical Approximation to evaluate Noise Levels and Maximum Coupling Frequencies During DPI Simulations on BMS IC. Asia Pacific International Conference on EMC (APEMC) 2022, Sep 2022, Beijing, China. ⟨10.1109/APEMC53576.2022.9888479⟩. ⟨hal-03773319⟩
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