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Conference Papers Year : 2022

Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level

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1
Alexandre Boyer
Nicolas Nolhier
Sonia Ben Dhia

Abstract

Near-Field Scan Immunity (NFSI) is a powerful technique to identify root-cause of failures produced during radiated immunity tests at IC level. However, a prediction method of the radiated immunity level from NFSI results is still missing. Such a method would help designers to anticipate risks of radiated immunity non-compliance after a near-field scan campaign. This paper presents the equivalence between far-field and near-field coupling on an electrically short interconnected in order to derive an estimator of IC radiated susceptibility in TEM/GTEM cell from NFSI. This estimator is tested and validated on near-field scan results on a bandgap reference. Moreover, the proposed approach relies on calibrated injection probes. As no technical specification defines a standard calibration method, this paper addresses also this issue.
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Dates and versions

hal-03773209 , version 1 (09-09-2022)

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Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia. Correlation between Near-Field Scan Immunity and Radiated Susceptibility at Integrated Circuit Level. International Symposium on Electromagnetic Compatibility (EMC Europe 2022), Sep 2022, Goteborg, Sweden. ⟨10.1109/EMCEurope51680.2022.9900970⟩. ⟨hal-03773209⟩
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